Tektronix unveils precision bench DMM

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Tektronix unveils precision bench DMM

New DMM4000 Family Offers 5.5 and 6.5 digit resolution and integration with other Tektronix bench instrumentation

Wednesday, October 07, 2009

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BANGALORE, INDIA: Tektronix Inc., a provider of test, measurement and monitoring instrumentation, announced on Tuesday the DMM4000 Series of 5.5 digit and 6.5 digit resolution digital multimeters (DMM) designed to help engineers debug complex electronics and validate circuit design through precision measurements and in-depth analysis capabilities.

In addition, the DMM Series integrates with National Instruments LabVIEW SignalExpress interactive instrument software for quickly acquiring, analyzing, and presenting data from multiple instruments.

With the addition of the DMM4000 Series, Tektronix offers customers an expanded portfolio of powerful bench instruments that can be connected for correlated measurements and data recording offering extended debug capabilities, said a press release.

As the circuits in embedded system designs become more sophisticated and demand tighter tolerances, engineers need to precisely measure, debug and validate circuits across a wide range of signal types and parameters with a high degree of accuracy.

This need is best met with an integrated set of tools including oscilloscopes, signal generators and DMMs that are easy to use, reliable and offer advanced analytical capabilities.

"The new Tektronix DMM family fits well with Tektronix MSO/DPO oscilloscopes, logic analyzers and AFG3000 function generators by offering engineers advanced capabilities and superior ease of use," said Bob Bluhm, vice president, Value Products and Accessories Product Line, Tektronix.

"As part of the Tektronix intelligent debug strategy, we have worked with National Instruments to ensure the DMM Series is integrated with NI LabVIEW SignalExpress instrument software, in keeping with our other bench products," Bluhm added.

He said now, its customer's entire Tektronix bench can be connected through one software interface for instrument control, automated measurements, data logging and extensive analysis of correlated signals.

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