Electronics industry taking short cuts

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Electronics industry taking short cuts

The problem for dynamic random access memory (DRAM) is enormous

Monday, October 26, 2009

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AUSTIN, TEXAS: A study has revealed that the electronics industry is taking short cuts, or curtailing its in-house memory test procedures, which, in turn, has resulted in a huge amount of failures for NAND, DRAMs and related devices in the consumer market.

The study by VLSI Research was conducted with "commodity servers" over two and a half years, and the data collected covers multiple vendors and DRAMs. .

The problem for dynamic random access memory (DRAM) is enormous, the study says, adding that errors in DRAM are a frequent form of hardware failure in modern compute clusters. The failures have proved costly regarding both service disruption and costs of hardware replacement.

As an example, the study cites that DRAM error rates are higher than previously reported – with 25,000 to 70,000 errors per billion device hours per Mbit, with over 8 per cent of DIMMs affected by errors a year. The erring vendors have not been named.

According to Dan Hutcheson, president of VLSI Research Inc., there is also a good deal of failures for NAND devices, leading to problems for USB flash drives and other products.

The memory failures are the result of OEMs, chip makers and test houses cutting back, or even taking shortcuts, on the memory test process in their bid to reduce costs, Hutcheson explained.

The study has not changed its overall forecast for IC, which is minus 13.4 per cent for 2009. However, the demand is bright, after a big downturn in the first quarter.

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